发明名称 ステージ装置および試料観察装置
摘要 <p>In order to provide a stage apparatus with high speed stability in addition to being able to achieve positioning with a high degree of accuracy, and a sample observation apparatus, such as an optical microscope and a scanning electron microscope, including the stage apparatus, the stage apparatus and the sample observation apparatus of the present invention correct a command voltage value of standard waveform data or an output timing of a command voltage value such that a difference between a first time history response and a second time history response is reduced to zero, the first time history response for displacement or speed when the stage mechanism is driven with use of the standard waveform data showing the command voltage value at each predetermined time and the second time history response for displacement or speed when a speed of the stage mechanism is constant, to be set as drive waveform data to be outputted to a drive unit of the stage mechanism.</p>
申请公布号 JP5747129(B2) 申请公布日期 2015.07.08
申请号 JP20140522459 申请日期 2013.04.12
申请人 发明人
分类号 G05D3/12;H01J37/20 主分类号 G05D3/12
代理机构 代理人
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