发明名称 プラズマ処理装置
摘要 <p>The present disclosure provides a plasma processing apparatus capable of improving uniformity of a process on a substrate surface. The plasma processing apparatus performs a process on a substrate accommodated in a processing chamber by generating inductively coupled plasma in the processing chamber. The plasma processing apparatus includes a processing chamber main body having a top opening and formed in a container shape; an upper lid, configured to cover the top opening, having a ceiling plate formed by alternately and concentrically arranging annular dielectric members and metal members, all having different diameters, and by airtightly sealing gaps between the dielectric members and the metal members; gas introduction units provided at the metal members, for supplying a processing gas into the processing chamber; and a high frequency coil provided on an upper portion of the dielectric members and provided at the outside of the processing chamber.</p>
申请公布号 JP5745812(B2) 申请公布日期 2015.07.08
申请号 JP20100240867 申请日期 2010.10.27
申请人 東京エレクトロン株式会社 发明人 飯塚 八城
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
代理机构 代理人
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