发明名称 |
PLASMA PROCESSING METHOD AND PLASMA PROCESSING DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a plasma processing method by which plasma can be securely maintained.SOLUTION: A plasma processing method used by a plasma processing device 10 that generates plasma P between an upper electrode 14 to which a VF power source 16 is connected and a susceptor 12 arranged opposite the upper electrode 14 and subjects a wafer W to plasma processing by the plasma P, includes: providing an auxiliary circuit 17 that decreases the difference between the reflection minimum frequency Fof a first path Lin which high frequency current generated from the VF power source 16 prior to ignition of plasma P and the reflection minimum frequency Fof a second path Lin which high frequency current generated from the VF power source 16 after the ignition of the plasma P; then igniting the plasma P; and maintaining the plasma P. |
申请公布号 |
JP2015122150(A) |
申请公布日期 |
2015.07.02 |
申请号 |
JP20130263996 |
申请日期 |
2013.12.20 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KOSHIMIZU CHISHIO;YAMAWAKI JUN |
分类号 |
H05H1/46;C23C16/509;H01L21/3065 |
主分类号 |
H05H1/46 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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