| 发明名称 |
TEST CIRCUIT OF SEMICONDUCTOR APPARATUS |
| 摘要 |
A test circuit of a semiconductor apparatus includes a plurality of memory blocks, and a comparison block configured to compare data of two memory blocks, wherein the two of the plurality of memory blocks do not share word lines. |
| 申请公布号 |
US2015187434(A1) |
申请公布日期 |
2015.07.02 |
| 申请号 |
US201414248429 |
申请日期 |
2014.04.09 |
| 申请人 |
SK hynix Inc. |
发明人 |
RIM A Ram |
| 分类号 |
G11C29/08;G06F11/26 |
主分类号 |
G11C29/08 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test circuit of a semiconductor apparatus, comprising:
a plurality of memory blocks; and a comparison block configured to compare data of two of the plurality of memory blocks, wherein the two of the plurality of memory blocks do not share word lines. |
| 地址 |
Icheon-si KR |
