发明名称 X-RAY DIFFRACTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an X-ray diffraction device which can simultaneously perform diffraction measurement with different wavelengths of the X-ray by using a commonly used X-ray tube, goniometer and the like.SOLUTION: An X-ray diffraction device having an X-ray generator (X-ray tube 11) for generating characteristic X-rays by irradiating electrons to a target, a sample holder 12 installing a sample, an X-ray detector and a goniometer 15, comprises: an X-ray introduction path which introduces a plurality of kinds of characteristic X-rays with different wavelengths generated from the X-ray generator to the sample holder 12, and introduces diffraction X-rays formed by diffracting the characteristic X-rays by the sample installed on the sample holder 12 to the X-ray detector with the plurality of kinds of wavelengths kept; and an energy dispersion type X-ray detector 14 installed as the X-ray detector.</p>
申请公布号 JP2015121501(A) 申请公布日期 2015.07.02
申请号 JP20130266314 申请日期 2013.12.25
申请人 SHIMADZU CORP 发明人 MARUI TAKAO
分类号 G01N23/207 主分类号 G01N23/207
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