发明名称 Removing method
摘要 A removing method including the following steps. A substrate is transferred into an etching machine, wherein the substrate has a material layer formed thereon. A cycle process is performed. The cycle process includes performing an etching process to remove a portion of the material layer, and performing an annealing process to remove a by-product generated by the etching process. The cycle process is repeated at least one time. The substrate is transferred out of the etching machine. In the removing method of the invention, the cycle process is performed multiple times to effectively remove the undesired thickness of the material layer and reduce the loading effect.
申请公布号 US9070635(B2) 申请公布日期 2015.06.30
申请号 US201313963688 申请日期 2013.08.09
申请人 United Microelectronics Corp. 发明人 Liao Chin-I;Tung Yu-Cheng
分类号 H01L21/302;H01L21/461;H01L21/311 主分类号 H01L21/302
代理机构 J.C. Patents 代理人 J.C. Patents
主权项 1. A removing method, comprising: transferring a substrate into an etching machine, wherein the substrate has a material layer formed thereon; performing a pre-annealing process before a cycle process, wherein a temperature of the pre-annealing process is from 150° C. to 190° C.; performing the cycle process, comprising: performing an etching process to remove a portion of the material layer; and performing an annealing process to remove a by-product generated by the etching process; repeating the cycle process at least one time; and transferring the substrate out of the etching machine, wherein an etching gas of the etching process comprises NF3 and NH3, and a volume flow rate ratio of NF3 to NH3 is greater than 1/10 and less than ½, wherein a radio frequency of the etching process is from 10 kW to 40 kW.
地址 Hsinchu TW