| 摘要 |
<p>The present invention relates to a connector for testing a probe card. More specifically, to a connector for testing a probe card which comprises: a base board which forms a number of through-hole columns and patterns for testing in the shape of a disk; a housing which is arranged in an upper side of each through-hole, respectively, and has a mounting space part to be communicated with each through-hole; a clamp plate which is located in the lower side of the contact, base board to be in contact with the probe cards for testing which are disposed in multiple along both sides of the housing and has a number of fixating holes corresponding to each through-hole; and an insertion plate which is mounted to the mounting space part of the housing and fixates the housing to the base board by being hooked to the fixating hole of the clamp plate. If the housing equipped with a contact is exchanged, since the end part of a fixating pin of the insertion hole of the clamp plate can be cut to separate from the base board, a test on the probe card can be executed by easily fixating the connector without any displacement and trembling in the horizontal direction, and moreover, can be easily separated at the exchange, thereby reducing cost and improving work efficiency.</p> |
