发明名称 METHOD AND SYSTEM FOR MULTI-PATH ACTIVE DEFECT DETECTION, LOCALIZATION AND CHARACTERIZATION WITH ULTRASONIC GUIDED WAVES
摘要 A method and system of detecting, localizing, and characterizing a defect at one or more spatial points of interest on a structure. The method may include collecting first data in a first state using one or more transducers on the structure, collecting second data in a second state subsequent to the first state, computing a scattered impulse response based on the collected first data and the collected second data, comparing the scattered impulse response with an estimated scattered impulse response corresponding to the case when damage is present at one or more spatial points of interest on the structure, and combining the generated comparison results to detect, localize, and characterize a defect at the one or more spatial points of interest on the structure.
申请公布号 US2015160169(A1) 申请公布日期 2015.06.11
申请号 US201314396373 申请日期 2013.01.25
申请人 HIDDEN SOLUTIONS, LLC 发明人 Hall James Stroman;Michaels Jennifer Emmons
分类号 G01N29/44;G01N29/04;G01M7/02 主分类号 G01N29/44
代理机构 代理人
主权项 1. A method of estimating a scattered impulse response at one or more spatial points of interest on a structure, comprising: collecting data at one or more spatial points of interest on the structure using a movable transducer, wherein the data collection includes individually exciting at least one transducer on the structure with a known excitation function and recording measurements with the movable transducer; computing an estimated scattered impulse response at the one or more spatial points of interest based on the collected data.
地址 Kissimmee FL US
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