发明名称 Semiconductor Integrated Circuit Device with Reduced Leakage Current
摘要 The gate tunnel leakage current is increased in the up-to-date process, so that it is necessary to reduce the gate tunnel leakage current in the LSI which is driven by a battery for use in a cellular phone and which needs to be in a standby mode at a low leakage current. In a semiconductor integrated circuit device, the ground source electrode lines of logic and memory circuits are kept at a ground potential in an active mode, and are kept at a voltage higher than the ground potential in an unselected standby mode. The gate tunnel leakage current can be reduced without destroying data.
申请公布号 US2015155031(A1) 申请公布日期 2015.06.04
申请号 US201414323064 申请日期 2014.07.03
申请人 Renesas Electronics Corporation 发明人 OSADA Kenichi;ISHIBASHI Koichiro;SAITOH Yoshikazu;NISHIDA Akio;NAKAMICHI Masaru;KITAI Naoki
分类号 G11C11/412 主分类号 G11C11/412
代理机构 代理人
主权项 1. (canceled)
地址 Kawasaki-shi JP
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