发明名称 SILICON CARBIDE EPI-WAFER AND METHOD OF FABRICATING THE SAME
摘要 A method of fabricating an epi-wafer includes providing a wafer in a susceptor, and growing an epi-layer on the wafer. The growing of the epi-layer on the wafer includes a first process of supplying a first input quantity of a raw material to the susceptor, and a second process of supplying a second input quantity of the raw material to the susceptor. The first input quantity is smaller than the second input quantity. An epi-wafer includes a wafer and an epi-layer formed on the wafer. Surface defects of the wafer are 1 ea/cm2 or less.
申请公布号 US2015144963(A1) 申请公布日期 2015.05.28
申请号 US201314404462 申请日期 2013.05.30
申请人 LG INNOTEK CO., LTD. 发明人 Kang SeokMin
分类号 H01L29/16 主分类号 H01L29/16
代理机构 代理人
主权项 1. An epi-wafer comprising: a wafer; and an epi-layer formed on the wafer, wherein surface defects of the epi-layer are 1 ea/cm2 or less.
地址 Seoul KR