发明名称 DEFECT MANAGEMENT POLICIES FOR NAND FLASH MEMORY
摘要 Systems and methods of managing defects in nonvolatile storage systems that can be used to avoid an inadvertent loss of data, while maintaining as much useful memory in the nonvolatile storage systems as possible. The disclosed systems and methods can monitor a plurality of trigger events for detecting possible defects in one or more nonvolatile memory (NVM) devices included in the nonvolatile storage systems, and apply one or more defect management policies to the respective NVM devices based on the types of trigger events that resulted in detection of the possible defects. Such defect management policies can be used proactively to retire memory in the nonvolatile storage systems with increased granularity, focusing the retirement of memory on regions of nonvolatile memory that are likely to contain a defect.
申请公布号 US2015149818(A1) 申请公布日期 2015.05.28
申请号 US201314087282 申请日期 2013.11.22
申请人 Kalavade Pranav;Zhu Feng;Raghunathan Shyam Sunder;Motwani Ravi H. 发明人 Kalavade Pranav;Zhu Feng;Raghunathan Shyam Sunder;Motwani Ravi H.
分类号 G06F11/20 主分类号 G06F11/20
代理机构 代理人
主权项 1. A method of managing defects in a nonvolatile storage system, the nonvolatile storage system including one or more nonvolatile memory (NVM) devices, the method comprising: monitoring, by an NVM defect management policy engine, a plurality of trigger events for detecting possible defects in at least one NVM device, each of the plurality of trigger events having an associated type; having monitored at least one trigger event, determining the type of the trigger event by the NVM defect management policy engine; and applying, by the NVM defect management policy engine, at least one defect management policy to the NVM device based on the type of the trigger event.
地址 San Jose CA US