Peri-critical reflection spectroscopy devices, systems, and methods

摘要

Spectroscopy apparatuses oriented to the critical angle of the sample are described that detecting the spectral characteristics of a sample wherein the apparatus consists of an electromagnetic radiation source adapted to excite a sample with electromagnetic radiation introduced to the sample at a location at an angle of incidence at or near a critical angle of the sample; a transmitting crystal in communication with the electromagnetic radiation source and the sample, the transmitting crystal having a high refractive index adapted to reflect the electromagnetic radiation internally; a reflector adapted to introduce the electromagnetic radiation to the sample at or near an angle of incidence near the critical angle between the transmitting crystal and sample; and a detector for detecting the electromagnetic radiation from the sample. Also, provided herein are methods, systems, and kits incorporating the peri-critical reflection spectroscopy apparatus.

主权项

1. An apparatus comprising:
a source of electromagnetic radiation in at least a first wavelength and a second wavelength; a crystal having a high refractive index adapted to reflect the electromagnetic radiation in the at least first wavelength and second wavelength; a reflector adapted to introduce the electromagnetic radiation in the at least first wavelength and second wavelength to the sample at a location across a range of angles including a critical angle between the crystal and the sample; a detector for detecting a return electromagnetic radiation from each of the at least first wavelength and second wavelength from the sample.