发明名称 化合物半導体装置及びその製造方法
摘要 <p>An AlGaN/GaN-HEMT has a structure including: compound semiconductor layers formed on a substrate; a gate electrode, a gate pad that has a current path formed between the gate electrode and itself, and a semiconductor layer that is spontaneously polarized and piezoelectrically polarized, which are formed on the compound semiconductor layer; and a gate electrode connection layer formed on the semiconductor layer, wherein the gate electrode connection layer and the gate electrode are electrically connected with each other. This structure which is relatively simple allows the AlGaN/GaN-HEMT to realize an intended normally-off operation without causing such inconveniences as increase in a sheet resistance, increase in an on-resistance, and increase in a leakage current.</p>
申请公布号 JP5716737(B2) 申请公布日期 2015.05.13
申请号 JP20120502906 申请日期 2010.03.01
申请人 发明人
分类号 H01L21/338;H01L21/28;H01L29/41;H01L29/778;H01L29/812;H02M7/5387 主分类号 H01L21/338
代理机构 代理人
主权项
地址