发明名称 MEMORY CELL COMPRISING NON-SELF-ALIGNED HORIZONTAL AND VERTICAL CONTROL GATES
摘要 The present disclosure relates to a memory cell comprising a vertical selection gate extending in a trench made in a substrate, a floating gate extending above the substrate, and a horizontal control gate extending above the floating gate, wherein the floating gate also extends above a portion of the vertical selection gate over a non-zero overlap distance. Application mainly to the production of a split gate memory cell programmable by hot-electron injection.
申请公布号 US2015117117(A1) 申请公布日期 2015.04.30
申请号 US201414528785 申请日期 2014.10.30
申请人 STMicroelectronics (Rousset) SAS 发明人 La Rosa Francesco;Niel Stephan;Delalleau Julien;Regnier Arnaud
分类号 H01L27/115;H01L21/3205;H01L29/788;H01L29/423;H01L29/66;H01L29/78;G11C16/14;H01L21/3213 主分类号 H01L27/115
代理机构 代理人
主权项 1. A memory cell, comprising: a vertical selection gate extending in a trench made in a semiconductor substrate a floating gate extending on the substrate; a horizontal control gate extending above the floating gate, wherein the floating gate has a protuberance which extends beneath an upper surface of the substrate; and a first dielectric layer positioned within the substrate and between the protuberance of the floating gate and the vertical selection gate.
地址 Rousset FR