发明名称 |
Gob inspection system for glass product |
摘要 |
The problem is solved by generating a gob image A by capturing, with a line scanning camera, an image of a falling gob that has been cut off at an orifice; generating an image B by binarizing the gob image A with a boundary value that turns a general part of the gob black and turns a peripheral lustrous portion and a defect of the gob white; generating an image C by binarizing the gob image A with a boundary value that turns the entire gob white and turns a background black and inverting the black and white; generating an image D by combining the image B and the image C together; setting a region located a given number of pixels inside an outer edge of the black area of the image D as an inspection region; and inspecting the inspection region of the gob image A to determine whether the gob is good. |
申请公布号 |
US9019365(B2) |
申请公布日期 |
2015.04.28 |
申请号 |
US201013823399 |
申请日期 |
2010.09.17 |
申请人 |
Toyo Seikan Group Holdings, Ltd. |
发明人 |
Akaji Koichi |
分类号 |
G01T5/00;G06T7/00;B07C5/34;G01N21/85;G01N33/38;G01N21/958;G01N21/896 |
主分类号 |
G01T5/00 |
代理机构 |
Wenderoth, Lind & Ponack, L.L.P. |
代理人 |
Wenderoth, Lind & Ponack, L.L.P. |
主权项 |
1. A gob inspection system comprising:
a line scanning camera configured to scan, in a horizontal direction, a falling gob that has been cut off at an orifice; and processing means for processing data from the line scanning camera, wherein the processing means generates a gob image A by arranging lines of the data sequentially in a vertical direction; generates an image B by binarizing the gob image A with a boundary value that turns a general part of the gob black and turns a peripheral lustrous portion and a defect of the gob white; generates an image C by binarizing the gob image A with a boundary value that turns the entire gob white and turns a background black and inverting the black and white; generates an image D by combining the image B and the image C together; sets a region located a given number of pixels inside an outer edge of the black area of the image D as an inspection region; and inspects the inspection region of the gob image A to determine whether the gob is good. |
地址 |
Tokyo JP |