发明名称 |
Process for manufactuirng super-barrier rectifiers |
摘要 |
A process for manufacturing a semiconductor device, wherein a semiconductor layer is formed on a body of semiconductor material; a first mask is formed on the semiconductor layer; a first conductive region is implanted in the body using the first mask; a second mask is formed laterally and complementarily to the first mask, at least in a projection in a plane parallel to the surface of the body; a second conductive region is implanted in the body using the second mask, in an adjacent and complementary position to the first conductive region; spacers are formed on the sides of the second mask region, to form a third mask aligned to the second mask; and, using the third mask, portions of the semiconductor layer are removed to form a gate region. |
申请公布号 |
US9018048(B2) |
申请公布日期 |
2015.04.28 |
申请号 |
US201314032123 |
申请日期 |
2013.09.19 |
申请人 |
STMicroelectronics S.r.l. |
发明人 |
Lizio Francesco |
分类号 |
H01L21/332;H01L29/66;H01L21/266;H01L29/861;H01L21/265;H01L29/417;H01L29/78;H01L29/08 |
主分类号 |
H01L21/332 |
代理机构 |
Seed IP Law Group PLLC |
代理人 |
Seed IP Law Group PLLC |
主权项 |
1. A process for manufacturing a semiconductor device, comprising:
forming a semiconductor layer on a surface of a semiconductor body; forming a first mask on the semiconductor layer; forming a first conductive region in the body by introducing a first dopant species into the body using the first mask; forming a second mask laterally and complementarily to the first mask, at least in a projection in a plane parallel to the surface of the body; forming a second conductive region in the body by introducing a second dopant species into the body using the second mask, in an adjacent and complementary position to the first conductive region; forming a third mask aligned to the second mask by forming spacers on sides of the second mask; and forming a gate region by removing portions of the semiconductor layer using the third mask. |
地址 |
Agrate Brianza IT |