发明名称 Process for manufactuirng super-barrier rectifiers
摘要 A process for manufacturing a semiconductor device, wherein a semiconductor layer is formed on a body of semiconductor material; a first mask is formed on the semiconductor layer; a first conductive region is implanted in the body using the first mask; a second mask is formed laterally and complementarily to the first mask, at least in a projection in a plane parallel to the surface of the body; a second conductive region is implanted in the body using the second mask, in an adjacent and complementary position to the first conductive region; spacers are formed on the sides of the second mask region, to form a third mask aligned to the second mask; and, using the third mask, portions of the semiconductor layer are removed to form a gate region.
申请公布号 US9018048(B2) 申请公布日期 2015.04.28
申请号 US201314032123 申请日期 2013.09.19
申请人 STMicroelectronics S.r.l. 发明人 Lizio Francesco
分类号 H01L21/332;H01L29/66;H01L21/266;H01L29/861;H01L21/265;H01L29/417;H01L29/78;H01L29/08 主分类号 H01L21/332
代理机构 Seed IP Law Group PLLC 代理人 Seed IP Law Group PLLC
主权项 1. A process for manufacturing a semiconductor device, comprising: forming a semiconductor layer on a surface of a semiconductor body; forming a first mask on the semiconductor layer; forming a first conductive region in the body by introducing a first dopant species into the body using the first mask; forming a second mask laterally and complementarily to the first mask, at least in a projection in a plane parallel to the surface of the body; forming a second conductive region in the body by introducing a second dopant species into the body using the second mask, in an adjacent and complementary position to the first conductive region; forming a third mask aligned to the second mask by forming spacers on sides of the second mask; and forming a gate region by removing portions of the semiconductor layer using the third mask.
地址 Agrate Brianza IT