发明名称 |
PROCESSING METHOD OF SILICON SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide a processing method of a silicon substrate capable of easily suppressing lateral spread of an opening of a through-hole due to over-etching even when performing double-side processing onto the silicon substrate to form the through-hole.SOLUTION: A processing method of a silicon substrate includes: a process for preparing a silicon substrate having a first surface and a second surface; a process for forming non-through-hole extended toward the second surface side from the first surface on the silicon substrate; a process for sticking a seal tape having a support member and an adhesive layer to the first surface and filling at least a part of the non-through hole with the adhesive layer; a process for performing reactive ion etching toward the first surface side from the second surface, making the reactive ion etching reach the adhesive layer filled in the non-through-hole to expose the adhesive layer; and a process for stripping the seal tape from the silicon substrate and forming a through-hole through the silicon substrate. |
申请公布号 |
JP2015080900(A) |
申请公布日期 |
2015.04.27 |
申请号 |
JP20130219641 |
申请日期 |
2013.10.22 |
申请人 |
CANON INC |
发明人 |
MINAMI SEIKO;SAKAI TOSHIYASU;KATO MASATAKA;UYAMA MASAYA;HIGUCHI HIROSHI;OGATA MINAO |
分类号 |
B41J2/16;B41J2/045;B41J2/055;B81C1/00;H01L21/306;H01L21/3065 |
主分类号 |
B41J2/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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