发明名称 PROCESSING METHOD OF SILICON SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a processing method of a silicon substrate capable of easily suppressing lateral spread of an opening of a through-hole due to over-etching even when performing double-side processing onto the silicon substrate to form the through-hole.SOLUTION: A processing method of a silicon substrate includes: a process for preparing a silicon substrate having a first surface and a second surface; a process for forming non-through-hole extended toward the second surface side from the first surface on the silicon substrate; a process for sticking a seal tape having a support member and an adhesive layer to the first surface and filling at least a part of the non-through hole with the adhesive layer; a process for performing reactive ion etching toward the first surface side from the second surface, making the reactive ion etching reach the adhesive layer filled in the non-through-hole to expose the adhesive layer; and a process for stripping the seal tape from the silicon substrate and forming a through-hole through the silicon substrate.
申请公布号 JP2015080900(A) 申请公布日期 2015.04.27
申请号 JP20130219641 申请日期 2013.10.22
申请人 CANON INC 发明人 MINAMI SEIKO;SAKAI TOSHIYASU;KATO MASATAKA;UYAMA MASAYA;HIGUCHI HIROSHI;OGATA MINAO
分类号 B41J2/16;B41J2/045;B41J2/055;B81C1/00;H01L21/306;H01L21/3065 主分类号 B41J2/16
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