发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p>PROBLEM TO BE SOLVED: To provide a trench gate MOSFET and a manufacturing method of the same, which can easily form narrow-pitch trench grooves.SOLUTION: In a semiconductor device, a thick insulation film 10 is formed on a corner part 8 of a surface of a trench groove 4 by oxidizing a part of a gate electrode 6 filled in the trench groove and a part of a semiconductor substrate surface. The thick insulation film reduces field concentration at a gate electrode lead-out part; and prevents the insulation film at the corner part from leading to insulation breakdown; and shields ion obliquely implanted into a trench lateral face at a transistor part when a source region 3 is formed.</p>
申请公布号 JP2015082503(A) 申请公布日期 2015.04.27
申请号 JP20130217975 申请日期 2013.10.21
申请人 NEW JAPAN RADIO CO LTD 发明人 FURUKAWA NORIO
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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