发明名称 |
METHOD OF MAKING BACKSIDE ILLUMINATED IMAGE SENSORS |
摘要 |
A method of making a backside illuminated image sensor includes forming a first isolation structure in a pixel region of a substrate, where a bottom of the first isolation structure is exposed at a back surface of the substrate. The method further includes forming a second isolation structure in a peripheral region of the substrate, where the second isolation structure has a depth less than a depth of the first isolation structure. Additionally, the method includes forming an implant region adjacent to at least a portion of sidewalls of the first isolation structure, where the portion of the sidewalls is located closer to the back surface than a front surface of the substrate, and where the second isolation structure is free of the implant region. |
申请公布号 |
US2015111334(A1) |
申请公布日期 |
2015.04.23 |
申请号 |
US201414587687 |
申请日期 |
2014.12.31 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPNAY, LTD. |
发明人 |
HUANG Kuan-Chieh;WU Chih-Jen;HUANG Chen-Ming;YAUNG Dun-Nian;TU An-Chun |
分类号 |
H01L27/146;H01L31/18 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
1. A method of making a backside illuminated image sensor, the method comprising:
forming a first isolation structure in a pixel region of a substrate, wherein a bottom of the first isolation structure is exposed at a back surface of the substrate; forming a second isolation structure in a peripheral region of the substrate, wherein the second isolation structure has a depth less than a depth of the first isolation structure; and forming an implant region adjacent to at least a portion of sidewalls of the first isolation structure, wherein the portion of the sidewalls is located closer to the back surface than a front surface of the substrate, wherein the second isolation structure is free of the implant region. |
地址 |
Hsinchu TW |