发明名称 METHOD OF MAKING BACKSIDE ILLUMINATED IMAGE SENSORS
摘要 A method of making a backside illuminated image sensor includes forming a first isolation structure in a pixel region of a substrate, where a bottom of the first isolation structure is exposed at a back surface of the substrate. The method further includes forming a second isolation structure in a peripheral region of the substrate, where the second isolation structure has a depth less than a depth of the first isolation structure. Additionally, the method includes forming an implant region adjacent to at least a portion of sidewalls of the first isolation structure, where the portion of the sidewalls is located closer to the back surface than a front surface of the substrate, and where the second isolation structure is free of the implant region.
申请公布号 US2015111334(A1) 申请公布日期 2015.04.23
申请号 US201414587687 申请日期 2014.12.31
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPNAY, LTD. 发明人 HUANG Kuan-Chieh;WU Chih-Jen;HUANG Chen-Ming;YAUNG Dun-Nian;TU An-Chun
分类号 H01L27/146;H01L31/18 主分类号 H01L27/146
代理机构 代理人
主权项 1. A method of making a backside illuminated image sensor, the method comprising: forming a first isolation structure in a pixel region of a substrate, wherein a bottom of the first isolation structure is exposed at a back surface of the substrate; forming a second isolation structure in a peripheral region of the substrate, wherein the second isolation structure has a depth less than a depth of the first isolation structure; and forming an implant region adjacent to at least a portion of sidewalls of the first isolation structure, wherein the portion of the sidewalls is located closer to the back surface than a front surface of the substrate, wherein the second isolation structure is free of the implant region.
地址 Hsinchu TW