发明名称 METHODS TO INTRODUCE SUB-MICROMETER, SYMMETRY-BREAKING SURFACE CORRUGATION TO SILICON SUBSTRATES TO INCREASE LIGHT TRAPPING
摘要 Provided is a method for fabricating a nanopatterned surface. The method includes forming a mask on a substrate, patterning the substrate to include a plurality of symmetry- breaking surface corrugations, and removing the mask. The mask includes a pattern defined by mask material portions that cover first surface portions of the substrate and a plurality of mask space portions that expose second surface portions of the substrate, wherein the plurality of mask space portions are arranged in a lattice arrangement having a row and column, and the row is not oriented parallel to a [110] direction of the substrate. The patterning the substrate includes anisotropically removing portions of the substrate exposed by the plurality of spaces.
申请公布号 WO2015058105(A1) 申请公布日期 2015.04.23
申请号 WO2014US61178 申请日期 2014.10.17
申请人 STC.UNM 发明人 HAN, SANG, EON;HOARD, BRITTANY, R.;HAN, SANG, M.;GHOSH, SWAPNADIP
分类号 H01L31/0236;H01L31/18 主分类号 H01L31/0236
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