发明名称 |
Adaptive redundancy in three dimensional memory |
摘要 |
In a three-dimensional nonvolatile memory, physical layers are zoned according to expected error rate. Different redundancy schemes are applied to different zones so that a high degree of redundancy is applied to a zone with a high expected error rate and a low degree of redundancy is applied to a zone with a low expected error rate. |
申请公布号 |
US9015561(B1) |
申请公布日期 |
2015.04.21 |
申请号 |
US201414301497 |
申请日期 |
2014.06.11 |
申请人 |
SanDisk Technologies Inc. |
发明人 |
Hu Xinde |
分类号 |
G11C29/00;G06F11/10 |
主分类号 |
G11C29/00 |
代理机构 |
Davis Wright Tremaine LLP |
代理人 |
Davis Wright Tremaine LLP |
主权项 |
1. A method of operating a three-dimensional nonvolatile memory that is monolithically formed in a plurality of physical levels of memory cells disposed above a substrate, memory cells in the plurality of physical levels connected in series to foim vertical NAND strings, comprising:
categorizing the plurality of physical levels into at least a first category of physical levels and a second category of physical levels according to expected error rate, the first category of physical levels having a first expected error rate, the second category of physical levels having a second expected error rate that is less than the first expected error rate; performing a redundancy calculation for data in the first category of physical levels, across N blocks of the three-dimensional nonvolatile memory, to generate first redundant data; storing the first redundant data in a redundant block in the three-dimensional nonvolatile memory; performing a redundancy calculation for data in the second category of physical levels, across N+X blocks of the three-dimensional nonvolatile memory, to generate second redundant data; and storing the second redundant data in the redundant block. |
地址 |
Plano TX US |