发明名称 MAGNETIC RANDOM ACCESS MEMORY HAVING PERPENDICULAR ENHANCEMENT LAYER AND THIN REFERENCE LAYER
摘要 The present invention is directed to a spin transfer torque (STT) MRAM device having a perpendicular magnetic tunnel junction (MTJ) memory element. The memory element includes a perpendicular MTJ structure in between a non-magnetic seed layer and a non-magnetic cap layer. The MTJ structure comprises a magnetic free layer structure and a magnetic reference layer structure with an insulating tunnel junction layer interposed therebetween, an anti-ferromagnetic coupling layer formed adjacent to the magnetic reference layer structure, and a magnetic fixed layer formed adjacent to the anti-ferromagnetic coupling layer. At least one of the magnetic free and reference layer structures includes a non-magnetic perpendicular enhancement layer, which improves the perpendicular anisotropy of magnetic layers adjacent thereto.
申请公布号 US2015102441(A1) 申请公布日期 2015.04.16
申请号 US201414255884 申请日期 2014.04.17
申请人 Avalanche Technology, Inc. 发明人 Gan Huadong;Zhou Yuchen;Huai Yiming;Wang Zihui;Wang Xiaobin
分类号 H01L43/02;H01L43/10;H01L27/22 主分类号 H01L43/02
代理机构 代理人
主权项 1. A magnetic random access memory device comprising a plurality of magnetic tunnel junction (MTJ) memory elements, each of said memory elements comprising: a magnetic reference layer structure including a first and a second magnetic reference layers with a tantalum perpendicular enhancement layer interposed therebetween, said first magnetic reference layer comprising cobalt, iron, and boron, said first and said second magnetic reference layers having a first fixed magnetization direction substantially perpendicular to layer planes thereof; and an insulating tunnel junction layer formed adjacent to said first magnetic reference layer opposite said tantalum perpendicular enhancement layer.
地址 Fremont CA US