奈米线带隙分布的测量方法;Method for Evaluating Bandgap Distributions of Nanowires

摘要

一种奈米线带隙分布的测量方法，包括以下步骤：提供一基体，并于该基体设置复数个奈米线，该复数个奈米线平行于基体表面；形成至少一金属电极于所述基体表面，并与所述复数个奈米线相互接触；对上述形成有复数个奈米线及至少一金属电极的基体拍摄扫描电子显微镜(Scanning Electron Microscope, SEM)照片；分析上述扫描电子显微镜照片，获得该复数个奈米线的带隙分布。; disposing a number of paralleled nanowires on the surface of the substrate; disposing at least one metal electrode on the surface of the substrate and contacted to the nanowires; taking a photo to the substrate with the at least one metal electrode and the nanowires by a Scanning Electron Microscope and evaluating this photo to obtain the information of bandgap distributions of nanowires.