发明名称 High-voltage trench junction barrier Schottky diode
摘要 In a Schottky diode having an n+-type substrate, an n-type epitaxial layer, at least two p-doped trenches introduced into the n-type epitaxial layer, mesa regions between adjacent trenches, a metal layer functioning as a cathode electrode, and another metal layer functioning as an anode electrode, the thickness of the epitaxial layer is more than four times the depth of the trenches.
申请公布号 US9006858(B2) 申请公布日期 2015.04.14
申请号 US201214361988 申请日期 2012.11.12
申请人 Robert Bosch GmbH 发明人 Qu Ning;Goerlach Alfred
分类号 H01L29/47;H01L29/40;H01L29/872;H01L29/06 主分类号 H01L29/47
代理机构 Kenyon & Kenyon LLP 代理人 Kenyon & Kenyon LLP
主权项 1. A Schottky diode, comprising: an n+substrate; an n-epitaxial layer having a thickness D epi; at least two trenches introduced into the n-epitaxial layer, each trench having a width Wt and a depth Dt; mesa regions each having a width Wm, wherein each mesa region is provided between two adjacent trenches; a metal layer functioning as a cathode electrode on the rear side of the n+substrate of the Schottky diode; and a metal layer functioning as an anode electrode on the front side of the Schottky diode, the metal layer forming an ohmic contact with the trenches and a Schottky contact with the n-epitaxial layer; wherein: the following equation holds for the depth Dt of the trenches and the thickness D_epi of the n-epitaxial layer: K·Dt<D_epi, where K>4;the following equation holds for the ratio of the depth Dt of the trenches to the width Wm of the mesa regions: Dt/Wm≧2; andthe following relationship holds: NA·Wt>>ND·Wm, where NA is the doping concentration of the trenches, Wt is the width of each of the trenches, ND is the doping concentration of the n-epitaxial layer, and Wm is the width of the mesa region between two trenches.
地址 Stuttgart DE