发明名称 |
High-voltage trench junction barrier Schottky diode |
摘要 |
In a Schottky diode having an n+-type substrate, an n-type epitaxial layer, at least two p-doped trenches introduced into the n-type epitaxial layer, mesa regions between adjacent trenches, a metal layer functioning as a cathode electrode, and another metal layer functioning as an anode electrode, the thickness of the epitaxial layer is more than four times the depth of the trenches. |
申请公布号 |
US9006858(B2) |
申请公布日期 |
2015.04.14 |
申请号 |
US201214361988 |
申请日期 |
2012.11.12 |
申请人 |
Robert Bosch GmbH |
发明人 |
Qu Ning;Goerlach Alfred |
分类号 |
H01L29/47;H01L29/40;H01L29/872;H01L29/06 |
主分类号 |
H01L29/47 |
代理机构 |
Kenyon & Kenyon LLP |
代理人 |
Kenyon & Kenyon LLP |
主权项 |
1. A Schottky diode, comprising:
an n+substrate; an n-epitaxial layer having a thickness D epi; at least two trenches introduced into the n-epitaxial layer, each trench having a width Wt and a depth Dt; mesa regions each having a width Wm, wherein each mesa region is provided between two adjacent trenches; a metal layer functioning as a cathode electrode on the rear side of the n+substrate of the Schottky diode; and a metal layer functioning as an anode electrode on the front side of the Schottky diode, the metal layer forming an ohmic contact with the trenches and a Schottky contact with the n-epitaxial layer; wherein:
the following equation holds for the depth Dt of the trenches and the thickness D_epi of the n-epitaxial layer: K·Dt<D_epi, where K>4;the following equation holds for the ratio of the depth Dt of the trenches to the width Wm of the mesa regions: Dt/Wm≧2; andthe following relationship holds: NA·Wt>>ND·Wm, where NA is the doping concentration of the trenches, Wt is the width of each of the trenches, ND is the doping concentration of the n-epitaxial layer, and Wm is the width of the mesa region between two trenches. |
地址 |
Stuttgart DE |