| 摘要 |
FIELD: physics.SUBSTANCE: method comprises constructing a full directional mask, constructing an internal directional mask, constructing an external directional mask with the same orientation as the direction orthogonal to the predominant direction of texture, for each pixel and with the same orientation as the direction orthogonal to the predominant direction of texture, for each pixel and with the same orientation as the direction orthogonal to the predominant direction of texture for each pixel, calculating the minima and maxima of brightness values of pixels within the full directional mask and within the internal directional mask, the external directional mask standard deviation from the brightness values of pixels within the full directional mask around the central pixel; calculating standard deviation or another statistical function, describing the degree of variation of samples within a sample, from the brightness values of pixels around the central pixel; calculating standard deviation or another statistical function, describing the degree of variation of samples within the sample, from brightness values of pixels around the central pixel.EFFECT: higher accuracy of image processing.41 cl, 33 dwg |
