发明名称 On-chip probe circuit for detecting faults in an FPGA
摘要 An integrated circuit includes a clock input, a first output, and a second output. A programmable pulse generator has a programmable pulse counter coupled to the clock input at least one control input for receiving count information. A fixed delay element is coupled to the programmable pulse counter. A programmable delay element is coupled to the programmable pulse counter and has at least one control input for receiving delay information. A first multiplexer is coupled to the fixed delay element, the programmable delay element and to the first output. A second multiplexer is coupled to the programmable delay element, the output of the fixed delay element and the second output.
申请公布号 US9000807(B2) 申请公布日期 2015.04.07
申请号 US201313933332 申请日期 2013.07.02
申请人 Microsemi SoC Corporation 发明人 Greene Jonathan W.;Kannemacher Dirk;Hecht Volker;Speers Theodore
分类号 H03K19/00;H03L7/06;H03K19/02;H03L7/00 主分类号 H03K19/00
代理机构 Leech Tishman Fuscaldo & Lampl 代理人 Leech Tishman Fuscaldo & Lampl ;D'Alessandro Kenneth
主权项 1. An integrated circuit including: a clock input; a first output; a second output; a fixed delay element having an input coupled to the clock input and an output; a programmable delay element having an input coupled to the clock input, an output, and at least one control input for receiving delay information; a first multiplexer having a first data input coupled to the output of the fixed delay element, a second data input coupled to the output of the programmable delay element, an output coupled to the first output, and a control input; and a second multiplexer having a first data input coupled to the output of the programmable delay element, a second data input coupled to the output of the fixed delay element, an output coupled to the second output, and a control input.
地址 San Jose CA US