发明名称 |
On-chip probe circuit for detecting faults in an FPGA |
摘要 |
An integrated circuit includes a clock input, a first output, and a second output. A programmable pulse generator has a programmable pulse counter coupled to the clock input at least one control input for receiving count information. A fixed delay element is coupled to the programmable pulse counter. A programmable delay element is coupled to the programmable pulse counter and has at least one control input for receiving delay information. A first multiplexer is coupled to the fixed delay element, the programmable delay element and to the first output. A second multiplexer is coupled to the programmable delay element, the output of the fixed delay element and the second output. |
申请公布号 |
US9000807(B2) |
申请公布日期 |
2015.04.07 |
申请号 |
US201313933332 |
申请日期 |
2013.07.02 |
申请人 |
Microsemi SoC Corporation |
发明人 |
Greene Jonathan W.;Kannemacher Dirk;Hecht Volker;Speers Theodore |
分类号 |
H03K19/00;H03L7/06;H03K19/02;H03L7/00 |
主分类号 |
H03K19/00 |
代理机构 |
Leech Tishman Fuscaldo & Lampl |
代理人 |
Leech Tishman Fuscaldo & Lampl ;D'Alessandro Kenneth |
主权项 |
1. An integrated circuit including:
a clock input; a first output; a second output; a fixed delay element having an input coupled to the clock input and an output; a programmable delay element having an input coupled to the clock input, an output, and at least one control input for receiving delay information; a first multiplexer having a first data input coupled to the output of the fixed delay element, a second data input coupled to the output of the programmable delay element, an output coupled to the first output, and a control input; and a second multiplexer having a first data input coupled to the output of the programmable delay element, a second data input coupled to the output of the fixed delay element, an output coupled to the second output, and a control input. |
地址 |
San Jose CA US |