| 摘要 |
The proposed approach includes a method and system for managing integrated circuit (IC) design information for multiple data stores. Each data store is split into sections, allowing larger data sets to be compared. Keys are assigned to objects in each data set, in order to determine if objects are added, deleted, or modified between multiple data stores, and also to determine object differences. The user may compare and merge differences between the data stores, using either a graphical or text-based approach. The proposed approach is highly efficient and accurate for large databases. The proposed approach allows the user to easily visualize differences in complex databases and to merge in desired changes easily. |
