发明名称 PHOTO-ALIGNMENT IRRADIATION DEVICE AND METHOD FOR ADJUSTING APERTURE OF PHOTO-ALIGNMENT IRRADIATION DEVICE
摘要 <p>[Problem] To measure the integrated amount of light emitted through an aperture in a photo-alignment irradiation device equipped with a partially-shielding member for adjusting the blocked amount of light emitted through the aperture to determine the amount of light blocked by the partially-shielding member. [Solution] A photo-alignment irradiation device according to the present invention is characterized by performing alignment processing during which a substrate is irradiated with polarized light emitted through the aperture while a scanning unit moves a polarized light irradiation unit and a stage relative to each other, and measurement processing during which a photosensor receives the polarized light emitted through the aperture at each position of the partially-shielding member while the scanning unit moves the stage and the polarized light irradiation unit relative to each other, and the integrated amount of light is measured by temporally integrating illuminance measured by the photosensor.</p>
申请公布号 WO2015040664(A1) 申请公布日期 2015.03.26
申请号 WO2013JP74997 申请日期 2013.09.17
申请人 SHIN-ETSU ENGINEERING CO., LTD.;FK OPT LABO CO., LTD. 发明人 OHTANI, YOSHIKAZU;NAKAMURA, MIZUKI
分类号 G02F1/1337 主分类号 G02F1/1337
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