发明名称 半導体装置の製造方法
摘要 In QFN packages for vehicles which are required to have high reliability, the side surface of leads is mostly covered with lead-to-lead resin protrusions, which prevent smooth formation of solder fillets during reflow mounting. When the lead-to-lead protrusions are mechanically removed using a punching die, there is a high possibility of causing cracks of the main body of the package or terminal deformation. When a spacing is provided between the punching die and the main body of the package in order to avoid such damages, a resin residue is produced to hinder complete removal of this lead-to-lead resin protrusion. The present invention provides a method for manufacturing semiconductor device of a QFN type package using multiple leadframes having a dam bar for tying external end portions of a plurality of leads. This method includes a step of removing a sealing resin filled between the circumference of a mold cavity and the dam bar by using laser and then carrying out surface treatment, for example, solder plating.
申请公布号 JP5689514(B2) 申请公布日期 2015.03.25
申请号 JP20130212719 申请日期 2013.10.10
申请人 ルネサスエレクトロニクス株式会社 发明人 藤澤 敦;藤井 浩志
分类号 H01L21/56;H01L23/50 主分类号 H01L21/56
代理机构 代理人
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