发明名称 |
METHODS OF FORMING SEMICONDUCTOR DEVICE STRUCTURES, AND RELATED SEMICONDUCTOR DEVICE STRUCTURES |
摘要 |
A method of forming a semiconductor device structure. The method comprises forming a block copolymer assembly comprising at least two different domains over an electrode. At least one metal precursor is selectively coupled to the block copolymer assembly to form a metal-complexed block copolymer assembly comprising at least one metal-complexed domain and at least one non-metal-complexed domain. The metal-complexed block copolymer assembly is annealed in to form at least one metal structure. Other methods of forming a semiconductor device structures are described. Semiconductor device structures are also described. |
申请公布号 |
US2015076436(A1) |
申请公布日期 |
2015.03.19 |
申请号 |
US201414546897 |
申请日期 |
2014.11.18 |
申请人 |
Micron Technology, Inc. |
发明人 |
Sills Scott E.;Millward Dan B. |
分类号 |
H01L45/00 |
主分类号 |
H01L45/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a semiconductor device structure, comprising:
forming a polymer material over an electrode; removing a portion of the polymer material to form a polymer pattern comprising at least one polymer structure and at least one opening; exposing the polymer pattern to a staining agent to form a metal-complexed polymer pattern comprising at least one metal-complexed polymer structure; and treating the metal-complexed polymer pattern to form at least one metal structure. |
地址 |
Boise ID US |