发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A semiconductor memory device according to an embodiment includes a semiconductor substrate, a first insulating film provided on the semiconductor substrate, a plurality of first electrodes provided on the first insulating film, a second insulating film provided on a side surface of the first electrodes and on an upper surface of the first electrodes, and a second electrode insulated from the first electrodes by the second insulating film. The second electrode includes an interconnect portion provided on the second insulating film, and a downward-extending portion extending into a space between the first electrodes from the interconnect portion. A lower end portion of the downward-extending portion is not covered with the second insulating film. |
申请公布号 |
US2015069487(A1) |
申请公布日期 |
2015.03.12 |
申请号 |
US201414162146 |
申请日期 |
2014.01.23 |
申请人 |
Kabushiki Kaisha Toshiba |
发明人 |
SATO Hiroyasu;Naito Hiroaki;Nagashima Satoshi |
分类号 |
H01L29/788;H01L21/28 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor memory device, comprising:
a semiconductor substrate; a first insulating film provided on the semiconductor substrate; a plurality of first electrodes provided on the first insulating film; a second insulating film provided on a side surface of the first electrodes and on an upper surface of the first electrodes; and a second electrode insulated from the first electrodes by the second insulating film, the second electrode including:
an interconnect portion provided on the second insulating film; anda downward-extending portion extending into a space between the first electrodes from the interconnect portion, a lower end portion of the downward-extending portion not being covered with the second insulating film. |
地址 |
Minato-ku JP |