发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 A semiconductor memory device according to an embodiment includes a semiconductor substrate, a first insulating film provided on the semiconductor substrate, a plurality of first electrodes provided on the first insulating film, a second insulating film provided on a side surface of the first electrodes and on an upper surface of the first electrodes, and a second electrode insulated from the first electrodes by the second insulating film. The second electrode includes an interconnect portion provided on the second insulating film, and a downward-extending portion extending into a space between the first electrodes from the interconnect portion. A lower end portion of the downward-extending portion is not covered with the second insulating film.
申请公布号 US2015069487(A1) 申请公布日期 2015.03.12
申请号 US201414162146 申请日期 2014.01.23
申请人 Kabushiki Kaisha Toshiba 发明人 SATO Hiroyasu;Naito Hiroaki;Nagashima Satoshi
分类号 H01L29/788;H01L21/28 主分类号 H01L29/788
代理机构 代理人
主权项 1. A semiconductor memory device, comprising: a semiconductor substrate; a first insulating film provided on the semiconductor substrate; a plurality of first electrodes provided on the first insulating film; a second insulating film provided on a side surface of the first electrodes and on an upper surface of the first electrodes; and a second electrode insulated from the first electrodes by the second insulating film, the second electrode including: an interconnect portion provided on the second insulating film; anda downward-extending portion extending into a space between the first electrodes from the interconnect portion, a lower end portion of the downward-extending portion not being covered with the second insulating film.
地址 Minato-ku JP