发明名称 |
METHOD FOR PRODUCING RETICLE, RETICLE PRODUCED BY THE PRODUCTION METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for producing reticle suppressing the increase of CAD data.SOLUTION: There is provided a method for producing a reticle used in the production of a semiconductor device, comprising: a step of inputting a first circuit pattern data for light proximity effect compensation including periodic compensation components into a first memory region of a drawing apparatus; and a step of inputting a first dimensional increase/decrease distribution data for compensating a circuit pattern to be drawn on a reticle substrate into a second memory region of the drawing apparatus, using the first circuit pattern data for light proximity effect compensation by the drawing apparatus. |
申请公布号 |
JP2015045720(A) |
申请公布日期 |
2015.03.12 |
申请号 |
JP20130176506 |
申请日期 |
2013.08.28 |
申请人 |
MICRON TECHNOLOGY INC |
发明人 |
SASAKI TAKAMIZU |
分类号 |
G03F1/24;G03F1/36;H01L21/027 |
主分类号 |
G03F1/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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