发明名称 INNER L-SPACER FOR REPLACEMENT GATE FLOW
摘要 An integrated circuit is formed by removing a sacrificial gate dielectric layer and a sacrificial gate to form a gate cavity. A conformal dielectric first liner is formed in the gate cavity and a conformal second liner is formed on the first liner. A first etch removes the second liner from the bottom of the gate cavity, leaving material of the second liner on sidewalls of the gate cavity. A second etch removes the first liner from the bottom of the gate cavity exposed by the second liner, leaving material of the first liner on the bottom of the gate cavity under the second liner on the sidewalls of the gate cavity. A third etch removes the second liner from the gate cavity, leaving an L-shaped spacers of the first liner in the gate cavity. A permanent gate dielectric layer and replacement gate are formed in the gate cavity.
申请公布号 US2015069516(A1) 申请公布日期 2015.03.12
申请号 US201314022317 申请日期 2013.09.10
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 LENOX Chet Vernon;SONG Seung-Chul;Kirkpatrick Brian K.
分类号 H01L21/8234;H01L27/092 主分类号 H01L21/8234
代理机构 代理人
主权项 1. An integrated circuit, comprising: a first metal oxide semiconductor (MOS) transistor of a first polarity, said first MOS transistor comprising: a permanent gate dielectric layer contacting a substrate of said integrated circuit; a replacement gate disposed on said permanent gate dielectric layer; and an L-shaped spacer of dielectric material disposed on said substrate and abutting said permanent gate dielectric layer, so that said permanent gate dielectric layer and said replacement gate overlap a lateral portion of said L-shaped spacer contacting said substrate, said L-shaped spacer extending vertically and abutting said permanent gate dielectric layer along a vertical surface; and a second MOS transistor of a second, opposite, polarity.
地址 DALLAS TX US