发明名称 |
X-RAY TESTING METHOD AND X-RAY TESTING DEVICE |
摘要 |
<p>A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (2) that produces transmission images and a second x-ray image of a circuit board that is equipped with components on both sides with a second x-ray device (4) that produces transmission images are recorded in an x-ray testing method for checking circuit boards that are equipped with components on two sides, in particular for checking soldered joints. A test x-ray image is then evaluated in a computer unit in which the second side that is equipped with components is displayed in enhanced form by forming a function from the pixel values of the first x-ray image and the corresponding pixel values of the second x-ray image.</p> |
申请公布号 |
EP1949087(B1) |
申请公布日期 |
2015.03.11 |
申请号 |
EP20060829032 |
申请日期 |
2006.11.13 |
申请人 |
MATRIX TECHNOLOGIES GMBH |
发明人 |
SPERSCHNEIDER, ECKHARD;RIMBACH, JAN;SOKOLOWSKI, MARTIN;MCGANN, TIMOTHY |
分类号 |
G01N23/04 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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