发明名称 X-RAY TESTING METHOD AND X-RAY TESTING DEVICE
摘要 <p>A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (2) that produces transmission images and a second x-ray image of a circuit board that is equipped with components on both sides with a second x-ray device (4) that produces transmission images are recorded in an x-ray testing method for checking circuit boards that are equipped with components on two sides, in particular for checking soldered joints. A test x-ray image is then evaluated in a computer unit in which the second side that is equipped with components is displayed in enhanced form by forming a function from the pixel values of the first x-ray image and the corresponding pixel values of the second x-ray image.</p>
申请公布号 EP1949087(B1) 申请公布日期 2015.03.11
申请号 EP20060829032 申请日期 2006.11.13
申请人 MATRIX TECHNOLOGIES GMBH 发明人 SPERSCHNEIDER, ECKHARD;RIMBACH, JAN;SOKOLOWSKI, MARTIN;MCGANN, TIMOTHY
分类号 G01N23/04 主分类号 G01N23/04
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