| 摘要 |
The present invention relates to a testing device, comprising a base unit to support a tested object guide unit to mount a tested object and a cover which is hinge-connected to the base unit to arrange a first probe being in contact with and being spaced apart from a tested contact point of the tested object. The testing device comprises: a base unit to support a tested object guide unit to mount a tested object; and a cover which is hinge-connected to the base unit to arrange a first probe being in contact with and being spaced apart from a tested contact point of the tested object. The base unit includes a second probe of which one end is in contact with a testing contact point of a test circuit board arranged at the lower part thereof. The cover includes a third probe arranged at a location corresponding to the second probe to be in contact with and to be spaced apart from the other end of the second probe by rotation of a hinge, wherein the first probe and the third probe of the cover are electrically connected to each other. |
