发明名称 DUAL DISCHARGE MODES OPERATION FOR REMOTE PLASMA
摘要 Embodiments of the present technology may include a method of processing a semiconductor substrate. The method may include providing the semiconductor substrate in a processing region. Additionally, the method may include flowing gas through a cavity defined by a powered electrode. The method may further include applying a negative voltage to the powered electrode. Also, the method may include striking a hollow cathode discharge in the cavity to form hollow cathode discharge effluents from the gas. The hollow cathode discharge effluents may then be flowed to the processing region through a plurality of apertures defined by electrically grounded electrode. The method may then include reacting the hollow cathode discharge effluents with the semiconductor substrate in the processing region.
申请公布号 US2015060265(A1) 申请公布日期 2015.03.05
申请号 US201414468066 申请日期 2014.08.25
申请人 Applied Materials, Inc. 发明人 Cho Tae Seung;Sen Yi-Heng;Park Soonam;Lubomirsky Dmitry
分类号 H01J37/32 主分类号 H01J37/32
代理机构 代理人
主权项 1. A method of processing a semiconductor substrate, the method comprising: flowing a gas through a cavity defined by a powered electrode; applying a negative voltage to the powered electrode; striking a hollow cathode discharge in the cavity to form hollow cathode discharge effluents from the gas; flowing the hollow cathode discharge effluents to a processing region through a plurality of apertures defined by an electrically grounded electrode; and reacting the hollow cathode discharge effluents with the semiconductor substrate in the processing region.
地址 Santa Clara CA US