发明名称 |
DUAL DISCHARGE MODES OPERATION FOR REMOTE PLASMA |
摘要 |
Embodiments of the present technology may include a method of processing a semiconductor substrate. The method may include providing the semiconductor substrate in a processing region. Additionally, the method may include flowing gas through a cavity defined by a powered electrode. The method may further include applying a negative voltage to the powered electrode. Also, the method may include striking a hollow cathode discharge in the cavity to form hollow cathode discharge effluents from the gas. The hollow cathode discharge effluents may then be flowed to the processing region through a plurality of apertures defined by electrically grounded electrode. The method may then include reacting the hollow cathode discharge effluents with the semiconductor substrate in the processing region. |
申请公布号 |
US2015060265(A1) |
申请公布日期 |
2015.03.05 |
申请号 |
US201414468066 |
申请日期 |
2014.08.25 |
申请人 |
Applied Materials, Inc. |
发明人 |
Cho Tae Seung;Sen Yi-Heng;Park Soonam;Lubomirsky Dmitry |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of processing a semiconductor substrate, the method comprising:
flowing a gas through a cavity defined by a powered electrode; applying a negative voltage to the powered electrode; striking a hollow cathode discharge in the cavity to form hollow cathode discharge effluents from the gas; flowing the hollow cathode discharge effluents to a processing region through a plurality of apertures defined by an electrically grounded electrode; and reacting the hollow cathode discharge effluents with the semiconductor substrate in the processing region. |
地址 |
Santa Clara CA US |