发明名称 PROBE FOR TESTING SECONDARY BATTERY
摘要 <p>The present invention relates to a probe for testing a secondary battery, which allows a stable test by contacting a voltage and a current of the secondary battery at the same time. The probe for testing a secondary battery comprises: an external plunger of which outside is penetrated and has a cylindrical shape; an internal plunger which is installed in the external plunger to protrude upward and downward and can vertically flow by an elasticity force; an external plunger head unit which has a cutting unit opened in an Y shape at the upper end of the external plunger and a first contact unit to be in contact with a terminal of a secondary battery while the other parts except for the cutting unit protrude upward; and an internal plunger head unit which has a second contact unit formed to be integrated in an Y shape to be in contact with the terminal of the secondary battery at the upper part of the internal plunger that is installed long in the external plunger in a length direction and an insulation block formed in an Y shape by inserting the second contact unit into the inside thereof to be coupled.</p>
申请公布号 KR101498617(B1) 申请公布日期 2015.03.04
申请号 KR20140011239 申请日期 2014.01.29
申请人 TAISELEC CO., LTD. 发明人 LEE, BYUNG SUNG;CHOI, WOO YONG
分类号 G01R1/067;G01R31/36 主分类号 G01R1/067
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