| 发明名称 | Test carrier and board assembly | ||
| 摘要 | A test carrier 10A comprises: a base board 21A which holds a die 90; and a cover board 31A which is laid over the base board 21A so as to cover the die 90. The test carrier 10A comprises a seal member 24 which is interposed between the base board 21A and the cover board 31A and which surrounds the die 90. | ||
| 申请公布号 | US8970243(B2) | 申请公布日期 | 2015.03.03 |
| 申请号 | US201213448839 | 申请日期 | 2012.04.17 |
| 申请人 | Advantest Corporation | 发明人 | Kogure Yoshinari;Fujisaki Takashi;Nakamura Kiyoto |
| 分类号 | G01R31/00;G01R1/04;G01R31/28 | 主分类号 | G01R31/00 |
| 代理机构 | Greenblum & Bernstein, P.L.C. | 代理人 | Greenblum & Bernstein, P.L.C. |
| 主权项 | 1. A test carrier comprising: a base board which directly holds an electronic device; a cover board which is laid over the base board so as to cover an upper surface of the electronic device; and a seal member which is interposed between the base board and the cover board and surrounds the electronic device, wherein the seal member comprises a ring-shaped elastic member, the ring-shaped elastic member has: an inside hole winch is formed to penetrate an upper surface and a lower surface of the ring-shaped elastic member; and an inner groove which is formed to open to the inside hole over a whole circumference of the inside hole, and part of the cover board is inserted in the inner groove. | ||
| 地址 | Tokyo JP | ||