X-ray characterization of solid small molecule organic materials

摘要

The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.

主权项

1. A system for characterizing crystallinity of an organic material comprising:
a) an x-ray beam source device adapted to subject the organic material to a high frequency x-ray beam having a wavelength less than or equal to 1.1 angstroms; b) a detector coupled to the x-ray beam source device and adapted to collect total scattering data that result from diffraction of the high frequency x-ray beam by the organic material; and c) a processor coupled to the detector and adapted to mathematically transform data generated by subjecting the organic material to the high frequency x-ray beam to provide a refined data set, wherein the refined data set is used to indicate a level of crystallinity of the organic material.