发明名称 INSPECTION APPARATUS AND INSPECTION METHOD
摘要 An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light.
申请公布号 US2015053869(A1) 申请公布日期 2015.02.26
申请号 US201414465435 申请日期 2014.08.21
申请人 DAINIPPON SCREEN MFG. CO., LTD. ;OSAKA UNIVERSITY 发明人 NAKANISHI Hidetoshi;ITO Akira;KAWAYAMA Iwao;TONOUCHI Masayoshi
分类号 G01N21/64 主分类号 G01N21/64
代理机构 代理人
主权项 1. An inspection apparatus for inspecting a photoelectric device, the inspection apparatus comprising: an excitation light irradiation part for irradiating said photoelectric device with excitation light for causing said photoelectric device to radiate an electromagnetic wave; a detection part for detecting the electromagnetic wave radiated from said photoelectric device in response to irradiation with said excitation light; and a temperature changing part for changing a temperature of said photoelectric device at a part irradiated with said excitation light.
地址 Kyoto-shi JP