发明名称 |
INSPECTION APPARATUS AND INSPECTION METHOD |
摘要 |
An inspection apparatus is an apparatus for inspecting a solar cell panel. The inspection apparatus includes: an excitation light irradiation part for irradiating the solar cell panel with pulsed light for causing the solar cell panel to radiate an electromagnetic wave pulse; a detection part for detecting the electromagnetic wave pulse radiated from the solar cell panel in response to irradiation with the pulsed light; and a temperature changing part for changing a temperature of the solar cell panel at a part irradiated with the pulsed light. |
申请公布号 |
US2015053869(A1) |
申请公布日期 |
2015.02.26 |
申请号 |
US201414465435 |
申请日期 |
2014.08.21 |
申请人 |
DAINIPPON SCREEN MFG. CO., LTD. ;OSAKA UNIVERSITY |
发明人 |
NAKANISHI Hidetoshi;ITO Akira;KAWAYAMA Iwao;TONOUCHI Masayoshi |
分类号 |
G01N21/64 |
主分类号 |
G01N21/64 |
代理机构 |
|
代理人 |
|
主权项 |
1. An inspection apparatus for inspecting a photoelectric device, the inspection apparatus comprising:
an excitation light irradiation part for irradiating said photoelectric device with excitation light for causing said photoelectric device to radiate an electromagnetic wave; a detection part for detecting the electromagnetic wave radiated from said photoelectric device in response to irradiation with said excitation light; and a temperature changing part for changing a temperature of said photoelectric device at a part irradiated with said excitation light. |
地址 |
Kyoto-shi JP |