发明名称 |
RELIABILITY OF PHYSICAL UNCLONABLE FUNCTION CIRCUITS |
摘要 |
Techniques and circuits are disclosed for obtaining a physical unclonable function (PUF) circuit that is configured to provide, during a first operational mode, an output signal that is dependent on an electric characteristic of the PUF circuit. Techniques and circuits described herein can cause the PUF circuit to enter a second operational mode by applying a stress signal to the PUF circuit that changes a value of the electric characteristic relative to another value of the electric characteristic during the first operational mode of the PUF circuit; and adjusting, based on changing the absolute value of the first electric characteristic, a bias magnitude of the output signal relative to another bias magnitude of the output signal during the first operational mode of the PUF circuit. |
申请公布号 |
WO2015027070(A1) |
申请公布日期 |
2015.02.26 |
申请号 |
WO2014US52110 |
申请日期 |
2014.08.21 |
申请人 |
CARNEGIE MELLON UNIVERSITY |
发明人 |
BHARGAVA, MUDIT;MAI, KENNETH WEI-AN |
分类号 |
H04L9/32 |
主分类号 |
H04L9/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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