| 摘要 |
<p>The present invention relates to a probe pin for a semiconductor device test socket, which has enhanced signal properties. The probe pin includes: an upper terminal including a first plunger; a lower terminal including a second plunger; an elastic member which provides an elastic force to the upper and lower terminals after being inserted into the first and second plungers; and a barrel which stores the upper terminal, lower terminal, and elastic member. The inner surfaces of the plungers constituting the upper and lower terminals, and the barrel are insulated.</p> |
