| 摘要 |
An electron microscopy sample support comprises: a support member; and a metal foil comprising a porous region. The support member is configured to give structural stability to the metal foil, and the porous region of the metal foil is configured to receive an electron microscopy sample. Also provided is a method of manufacturing such an electron microscopy sample support, a method of imaging using such an electron microscopy sample support and an apparatus operable to perform such imaging. An electron microscopy specimen support in accordance with aspects and embodiments may reduce particle motion and/or sample charging in electron microscopy, and thus improve information content available from electron micrographs. Appropriately designed and constructed supports may lead to an increased resolution per particle and increased accuracy of angular assignments in 3D reconstructions of, for example, biological specimens. This may enable the determination of structures of smaller and more difficult proteins than was previously possible using EM techniques. |
