发明名称 Parameter learning method, parameter learning apparatus, pattern classification method, and pattern classification apparatus
摘要 <p>A plurality of pieces of learning data, each associated with a class to which the piece of the learning data belong, are input. In each piece of the learning data, a statistical amount of attribute values of elements in each of specific k parts, k being equal to or larger than 1, is calculated. Each piece of the learning data is mapped in a k-dimensional feature space as a vector having the calculated k statistics amounts as elements. Based on each piece of the mapped learning data and the classes to which the pieces of learning data belong, parameters for classifying input data into one of the plurality of classes are learned in the k-dimensional feature space. By using the parameters, pattern classification can be performed with high speed and high accuracy. </p>
申请公布号 EP1873687(A3) 申请公布日期 2015.02.18
申请号 EP20070110987 申请日期 2007.06.25
申请人 CANON KABUSHIKI KAISHA 发明人 MITARAI, YUSUKE;MATSUGU, MASAKAZU;MORI, KATSUHIKO;TORII, KAN;SATO, HIROSHI
分类号 G06K9/00;G06K9/62 主分类号 G06K9/00
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