发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREOF
摘要 A semiconductor integrated circuit, operable in a normal mode and a test mode, includes a demodulator, a demodulated signal processing section, a header analysis section, a payload processing section, and a control section. The demodulator demodulates a modulated wireless signal including a synchronization pattern, header, and payload, to generate a demodulated signal. The demodulated signal processing section detects the synchronization pattern from the demodulated signal, generates a synchronization detection signal synchronized to the synchronization pattern, and converts the demodulated signal into a received bit sequence. The header analysis section extracts and analyzes the header to obtain the number of bits of the payload. The payload processing section processes the payload. The control section disables the demodulator when processing of the number of bits in the payload is completed in the normal mode, and disables the demodulator synchronously with a signal indicating the end of a test in the test mode.
申请公布号 US2015036676(A1) 申请公布日期 2015.02.05
申请号 US201414194784 申请日期 2014.03.02
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 HATORI Fumitoshi
分类号 H04L12/26 主分类号 H04L12/26
代理机构 代理人
主权项 1. A semiconductor integrated circuit which is operable in a normal mode to perform a normal wireless communication and in a test mode, the semiconductor integrated circuit comprising: a demodulator configured to demodulate a modulated wireless signal including a synchronization pattern, a header, and a payload, to generate a demodulated signal; a demodulated signal processing section configured to detect the synchronization pattern from the demodulated signal, generate a synchronization detection signal synchronized to the synchronization pattern, and convert the demodulated signal into a received bit sequence; a header analysis section configured to extract and analyze the header from the received bit sequence to obtain the number of bits of the payload; a payload processing section configured to process the payload; and a control section configured to disable the demodulator in the normal mode when the processing of the payload is completed according to the number of bits of the payload extracted by the header analysis section, and disable the demodulator in the test mode synchronously with a control signal indicating the end of a test.
地址 Tokyo JP