| 摘要 |
PROBLEM TO BE SOLVED: To optimally adjust a competition timing at an arbitrary competition point of a plurality of data pieces.SOLUTION: A competition testing timing adjustment device includes: an event table 102 in which transactions for input of a semiconductor device and events are associated with each other; and a competition scenario generation unit 103. The competition scenario generation unit 103 refers to the event table 102 on the basis of an input of a pair of events that are to compete, and selects a plurality of transactions related to the pair of events for each set; adjusts an input timing of one transaction so as to match the time of the pair of events included in the selected one set of transactions; determines whether or not the time of another event included in the one transaction, for which the input timing is adjusted, mismatches the time of an identical event included in another transaction; and outputs a set of transactions, for which a mismatch is obtained as a determination result, and the adjusted input timing as a timing adjustment result for the pair of events that are to compete. |
