发明名称 METHOD FOR MANUFACTURING NITRIDE SEMICONDUCTOR DEVICE
摘要 <p>The invention provides a method for manufacturing a nitride semiconductor device that grows a multilayer film of a III-V group nitride semiconductor in a reaction furnace into which a III group element raw material gas and a V group element raw material gas are introduced, the method including: growing a first nitride semiconductor layer at a first raw material gas flow rate of the V group element raw material gas and a first carrier gas flow rate; and growing a second nitride semiconductor layer at a second raw material gas flow rate of the V group element raw material gas lower than the first raw material gas flow rate and a second carrier gas flow rate higher than the first carrier gas flow rate, wherein the first nitride semiconductor layer and the second nitride semiconductor layer are stacked.</p>
申请公布号 KR20150008403(A) 申请公布日期 2015.01.22
申请号 KR20147031696 申请日期 2013.04.19
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 SATO KEN;GOTO HIROKAZU;SHIKAUCHI HIROSHI;TSUCHIYA KEITARO;SHINOMIYA MASARU;HAGIMOTO KAZUNORI
分类号 H01L21/205;C23C16/34;C30B29/38;H01L21/338;H01L29/778;H01L29/812 主分类号 H01L21/205
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