首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
APPARATUS AND METHOD FOR MEASURING DOUBLE REFRACTION
摘要
申请公布号
JPH02205755(A)
申请公布日期
1990.08.15
申请号
JP19890026228
申请日期
1989.02.03
申请人
SEKISUI CHEM CO LTD
发明人
MIURA AKIHISA
分类号
G01N21/23;G11B11/10;G11B11/105
主分类号
G01N21/23
代理机构
代理人
主权项
地址
您可能感兴趣的专利
ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD
Candle
Non-contact information storage medium and data transmission method for the medium
Two-part low density curing epoxy composition and use thereof as void filler
Methods and compositions for dispensing fragrances
Method and apparatus for fixed canvas presentations using HTML
Magnetic stimulating apparatus for a living body
Thermoelectric module
Static semiconductor memory device capable of reducing precharging power dissipation
Process and device for purifying wastewater
FLEXIBLE INSULATED HEATER
Finely particulate polymer for stencil ink
Method and apparatus for determining the state of corrosion of a buried object
Connection assembly between a motherboard and a daugtherboard
STRUCTURING OF PRINTED CIRCUIT BOARDS
Ortho ester-substituted chlorotriazines as capping agents for polyphenylene ethers
SHAVING AID WITH INCREASED FLEXIBILITY
无级变速变位布料器
一种减震网球拍握把
热油加热源夹层锅
