发明名称 質量分析装置
摘要 <p><P>PROBLEM TO BE SOLVED: To secure accuracy of identification while shortening the time for analysis by suppressing the number of fractions to perform MS<SP POS="POST">2</SP>analysis thereon when comprehensively identifying substances contained in a sample. <P>SOLUTION: Regarding a three-dimensional graph, with a hold time, m/z and signal strength on three axes, created based on a result of performing MS<SP POS="POST">1</SP>analysis on all fraction samples (S1-S2), peak detection is performed by determining the strength with a threshold valueθ<SB POS="POST">N</SB>greater thanω, and the fraction sample in which a peak top of the detected peak is present, is selected as MS<SP POS="POST">2</SP>analysis target (S3-S5). Next, a peak of which the peak top is present in the selected fraction sample and of which the strength is equal to or greater the threshold valueωis detected and the detected peak is presented as a precursor ion candidate (S6). Then, MS<SP POS="POST">2</SP>analysis is executed successively on the precursor ion candidates until identifying substances contained in the selected fraction sample (S7-S9, S14-S15). Since many precursor ion candidates can be presented for one fraction sample, an identification probability of substances contained in the fraction sample is improved. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5655758(B2) 申请公布日期 2015.01.21
申请号 JP20110227620 申请日期 2011.10.17
申请人 发明人
分类号 G01N27/62 主分类号 G01N27/62
代理机构 代理人
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