发明名称 完全アモルファスの相変化メモリ細孔セルの化学機械研磨ストップ層
摘要 <p>A method for fabricating a phase change memory pore cell that includes forming a bottom electrode, forming a first dielectric layer on the bottom electrode, forming a sacrificial layer on the first dielectric layer, forming an isolation layer on the sacrificial layer, and forming a second dielectric layer on the isolation layer. The method further includes forming a via overlying the bottom electrode, the via extending to the sacrificial layer, etching through the sacrificial layer to the first dielectric layer to form a pore defined extending through the sacrificial layer and the first dielectric layer, depositing phase change material on the sacrificial layer and into the pore and removing the phase change material formed outside the pore, removing the sacrificial layer to expose the pore, the pore being vertically aligned, and forming a top electrode over the pore.</p>
申请公布号 JP5658254(B2) 申请公布日期 2015.01.21
申请号 JP20120526794 申请日期 2010.07.29
申请人 发明人
分类号 H01L27/105;H01L21/318;H01L45/00 主分类号 H01L27/105
代理机构 代理人
主权项
地址